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"Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM",
Beilstein Journal of Nanotechnology, vol. 3, pp. 301 - 311, 2012.
Abstract
"Force measurements with the atomic force microscope: Technique, interpretation and applications",
Surface Science Reports, vol. 59, no. 1-6, pp. 1–152, 2005.
Abstract
"Atomic Force Microscope",
Physical Review Letters, vol. 56, issue 9, pp. 930 - 933, 03/1986.
Abstract
"Advanced Techniques and Applications on Scanning Probe Microscopy",
Applied Physics Review Books: Research Signpost, 2008.
Abstract