<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Binnig, Greg</style></author><author><style face="normal" font="default" size="100%">Quate, Calvin F.</style></author><author><style face="normal" font="default" size="100%">Gerber, Christoph</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Atomic Force Microscope</style></title><secondary-title><style face="normal" font="default" size="100%">Physical Review Letters</style></secondary-title><short-title><style face="normal" font="default" size="100%">Phys. Rev. Lett.</style></short-title></titles><dates><year><style  face="normal" font="default" size="100%">1986</style></year><pub-dates><date><style  face="normal" font="default" size="100%">03/1986</style></date></pub-dates></dates><volume><style face="normal" font="default" size="100%">56</style></volume><pages><style face="normal" font="default" size="100%">930 - 933</style></pages><abstract><style face="normal" font="default" size="100%">&lt;p&gt;The scanning tunneling microscope is proposed as a method to measure forces as small as 10&lt;sup&gt;-18&lt;/sup&gt; N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30&amp;Aring; and a vertical resolution less than 1&amp;Aring;.&lt;/p&gt;
</style></abstract><issue><style face="normal" font="default" size="100%">9</style></issue></record></records></xml>