Titre | Atomic Force Microscope |
Publication Type | Journal Article |
Year of Publication | 1986 |
Authors | Binnig, G., C. F. Quate, and C. Gerber |
Journal | Physical Review Letters |
Volume | 56 |
Issue | 9 |
Pagination | 930 - 933 |
Date Published | 03/1986 |
ISSN | 0031-9007 |
Résumé | The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30Å and a vertical resolution less than 1Å. |
DOI | 10.1103/PhysRevLett.56.930 |
Short Title | Phys. Rev. Lett. |