Atomic Force Microscope

TitreAtomic Force Microscope
Publication TypeJournal Article
Year of Publication1986
AuthorsBinnig, G., C. F. Quate, and C. Gerber
JournalPhysical Review Letters
Pagination930 - 933
Date Published03/1986

The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30Å and a vertical resolution less than 1Å.

Short TitlePhys. Rev. Lett.